Patent · US Expired

Sampling phase detector for delay-locked loop

US7173460B2 · kind B2 · utility

5Cited by
2References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 12, 2005
Grant dateFeb 6, 2007
Priority date
Expiry dateMay 31, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03L7/091
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A delay-locked loop (DLL) architecture is provided that includes a voltage controlled delay line, a sample-and-hold circuit and an amplifier circuit. The voltage controlled delay line may have a plurality of buffer stages to provide a first clock signal and a second clock signal. The sample-and-hold circuit may receive signals corresponding to the first clock signal and the second clock signal. The sample-and-hold circuit may provide two sampled signals based on the received signals. Additionally, the amplifier circuit may be coupled to the sample-and-hold circuit and the voltage controlled delay line. The amplifier circuit may provide a control voltage to the buffer stages of the voltage controlled delay line based on the sampled signals received from the sample-and-hold circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.