Patent · US Expired

Quality/reliability system and method in multilevel manufacturing environment

US7174233B1 · kind B1 · utility

13Cited by
6References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 29, 2005
Grant dateFeb 6, 2007
Priority date
Expiry dateAug 29, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06Q10/06
  • WIPO fieldIT methods for management
  • WIPO sectorElectrical engineering

Abstract

This is a system and method for management system. The system and method includes a raw pull indicator database which receives inputs comprising data from participant nodes. A system comprises execution logic which operates on the data from the raw pull indicator. A disposition system feedbacks reliability data of the participants based on the data operated on by the system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.