Gathering I/O measurement data during an I/O operation process
US7174274B2 · kind B2 · utility
47Cited by
31References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 11, 2005 |
| Grant date | Feb 6, 2007 |
| Priority date | — |
| Expiry date | May 11, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/88
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
I/O measurement data associated with the performance of an I/O operation process is gathered during the I/O process. The I/O measurement data is saved in an IRB memory location specified by a test subchannel instruction. An I/O interrupt signals the completion of the I/O operation process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.