Patent · US Expired

Testing of applications

US7174541B2 · kind B2 · utility

12Cited by

3References

33Claims

0Family size

Assignee

SAP AG · DE

Inventors

Horst Müller · Schriesheim, DE
Jan Olsen · Malsch, DE
Thomas Lendroth · Leimen, DE
Marc Webster · Rochester, US
Nils Kirstaedter · Berlin, DE
Jens Fichtner · Leipzig, DE
Michael Schaffrath · Leipzig, DE

Key dates

Filing date	Jun 28, 2002
Grant date	Feb 6, 2007
Priority date	—
Expiry date	Feb 14, 2024

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/36
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Methods and apparatus, including computer program products, for testing a feature of a software application includes forming a feature call by incorporating test data into a data structure that is part of a test script and sending the feature call to the software application containing the feature for testing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.