Systems, methods and apparatus for determining deviation of an x-ray field, a light field and a primary receptor
US7176467B2 · kind B2 · utility
2Cited by
7References
88Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 2, 2004 |
| Grant date | Feb 13, 2007 |
| Priority date | — |
| Expiry date | Aug 30, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03B42/02
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Systems, methods and apparatus are provided through which, in some embodiments, an electronic sensor is positioned in the field of projection of an X-ray source, and the electronic sensor measures the deviation between a visible light field and an X-ray field. In some embodiments, the deviation is scaled in reference to the position of the electronic sensor between an X-ray receptor and the X-ray source.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.