Test probe with thermally activated grip and release
US7176703B2 · kind B2 · utility
3Cited by
11References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2004 |
| Grant date | Feb 13, 2007 |
| Priority date | — |
| Expiry date | Aug 31, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06738
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electrical test probe has a thermally activated, configurable shape probe tip. At low temperatures, the probe tip is in a generally hooked configuration. Upon heating, the probe tip is converted to a generally straight configuration. The probe tip is composed of a spring component bonded to a shape memory alloy component. The straight configuration allows placement of the probe between tightly spaced circuit pins, while the hooked configuration provides for tight gripping of a circuit pin during measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.