Patent · US Expired

Shape based noise characterization and analysis of LSI

US7177783B2 · kind B2 · utility

3Cited by
19References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 10, 2003
Grant dateFeb 13, 2007
Priority date
Expiry dateJan 4, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/367
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The invention allows the inclusion of cross-talk coupling and other noise in circuit simulation by considering a resultant glitch in more detail than just its peak value. A set of parameters represents the noise, with an exemplary embodiment using a triangle approximation to a glitch based on a set of three parameters: the peak voltage value, the leading edge slope and the trailing edge slope. These values are then used as the input stimulus to a given cell instance in the network in which the resulting propagated noise values, also in a triangle approximation, are determined by a simulation. The results can be stored as a library so that, given the parameters of the input noise and the particular cell, a simulation can determine the propagated noise through a look-up process. To reduce the space requirements of the library, the dimensionality of the look-up tables can be reduced through the introduction of a set of auxiliary functions to offset error from this reduction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.