Apparatus and methods for the inspection of objects
US7181059B2 · kind B2 · utility
31Cited by
17References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 12, 2003 |
| Grant date | Feb 20, 2007 |
| Priority date | — |
| Expiry date | Nov 12, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30141
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for inspecting electrical circuits, and a system for carrying out the method, generating a representation of boundaries of elements in an image of an electrical circuit which is under inspection, and analyzing at least some locations of at least some boundaries in the representation of boundaries of elements to identify defects in the electrical circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.