Patent · US Expired

Methods and systems for generating test plans for communication devices

US7181360B1 · kind B1 · utility

43Cited by
3References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 30, 2004
Grant dateFeb 20, 2007
Priority date
Expiry dateFeb 16, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04L41/22
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

A computer implemented method for generating a test plan for a communication device under test. The test plan defines test tools, test methodologies, test configurations, and algorithms for executing the test. A user input is received to define the communication device under test. Next, a knowledge database is searched to identify test plan parameters for the communication device under test. Thereafter, the test plan parameters and the user input are analyzed to identify the test plan. A system and computer readable medium having program instructions for generating a test plan for a communication device under test are also described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.