Patent · US Expired

Method of manufacturing semiconductor device

US7183146B2 · kind B2 · utility

12Cited by
6References
61Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 13, 2004
Grant dateFeb 27, 2007
Priority date
Expiry dateJan 13, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10K71/60
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

To provide a method for manufacturing a wiring, a conductive layer, a display device, and a semiconductor device, each of which can meet a large sized substrate and which is manufactured with a higher throughput by using a material efficiently, the conductive layer is formed over the substrate having an insulating surface by discharging the conductive material, and heat treatment is performed by a lamp or a laser beam over the conductive layer. Furthermore, the conductive film is formed under reduced pressure according to the present invention.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.