Patent · US Expired

Composite gate structure in an integrated circuit

US7183596B2 · kind B2 · utility

54Cited by
22References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 22, 2005
Grant dateFeb 27, 2007
Priority date
Expiry dateJun 22, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/62

Abstract

An integrated circuit having composite gate structures and a method of forming the same are provided. The integrated circuit includes a first MOS device, a second MOS device and a third MOS device. The gate stack of the first MOS device includes a high-k gate dielectric and a first metal gate on the high-k gate dielectric. The gate stack of the second MOS device includes a second metal gate on a high-k gate dielectric. The first metal gate and the second metal gate have different work functions. The gate stack of the third MOS device includes a silicon gate over a gate dielectric. The silicon gate is preferably formed over the gate stacks of the first MOS device and the second MOS device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.