Patent · US Expired

Soil probe device and method of making same

US7183779B2 · kind B2 · utility

19Cited by
122References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 28, 2004
Grant dateFeb 27, 2007
Priority date
Expiry dateDec 28, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N33/246
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A device for measuring one or more different properties of soil or a soil-related substance is provided. The device includes a probe that is inserted into the soil or soil-related substance. The probe includes a tip. The tip is electrically insulative and defines apertures. Electrodes are fitted into the apertures. The tip and electrodes are machined together to have a desired shape that is suitable for insertion into a sample. A printed circuit board (“PCB”) is located inside the probe. The electrodes are soldered directly to the PCB in one embodiment. A temperature sensing element is also located in the tip, near the electrodes, and is connected electrically to the PCB.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.