Reliability circuit for applying an AC stress signal or DC measurement to a transistor device

US7183791B2 · kind B2 · utility

Assignee

• LSI Logic Corporation · US

Inventors

• John D. Walker · Colorado Springs, US
• SangJune Park · Colorado Springs, US
• Richard T. Schultz · Fort Collins, US

Key dates

• Filing date: Oct 11, 2004
• Grant date: Feb 27, 2007
• Expiry date: Oct 11, 2024

Classification

• Technology area (CPC H): Electricity
• CPC primary: H01L2924/0002
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An integrated circuit is provided, which includes a transistor device under test, an AC drive circuit, an AC bias circuit and a DC bias circuit. The AC drive circuit generates an AC drive signal. The AC bias circuit biases the transistor device under AC bias conditions in response to the AC drive signal. The DC bias circuit biases the transistor device under DC bias conditions. A switch circuit selectively couples the transistor device to the AC bias circuit in an AC stress mode and to the DC bias circuit in a DC measurement mode.