Component specific machine wear determination with x-ray fluorescence spectrometry
US7184515B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 24, 2004 |
| Grant date | Feb 27, 2007 |
| Priority date | — |
| Expiry date | Sep 24, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
X-ray fluorescence analysis is used to determine wear of machine parts on a component-specific basis. The individual wetted wear surfaces of the machine are provided with a signature tagant composition, and as the components wear, the amounts of each tagant in the lubricating fluid are determined by the x-ray fluorescence analysis. An analysis system tracks the amounts of the tagants in the lubricating fluid, and with information of the signature tagant composition of each wear surface, calculates wear rate information for each of the wear surfaces. This component-specific wear information is then used in scheduling maintenance and predicting failures of the machine.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.