Method and system for examining tissue according to the dielectric properties thereof
US7184824B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 18, 2004 |
| Grant date | Feb 27, 2007 |
| Priority date | — |
| Expiry date | Oct 18, 2024 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B5/418
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A probe, method and system for examining tissue in order to differentiate it from other tissue according to the dielectric properties of the examined tissue are provided. The probe includes an inner conductor, having a plurality of sharp, thin, conductive spikes, at a proximal end with respect to a tissue for examination, the plurality of sharp, thin, conductive spikes being operative to enhance the electrical fringe fields, where interaction with the tissue for examination occurs. The method includes: applying the probe to the tissue to be examined, such that the probe generates an electrical fringe field in the zone of the examined tissue and produces a reflected pulse therefrom with negligible radiation penetrating into the tissue itself; detecting the reflected electrical pulse; and comparing electrical characteristics of the reflected electrical pulse with respect to the applied electrical pulse to provide an indication of the dielectric properties of the examined tissue.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.