Apparatus and method for testing memory cards
US7184916B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 19, 2004 |
| Grant date | Feb 27, 2007 |
| Priority date | — |
| Expiry date | Aug 1, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/4002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A memory daughter card (MDC) is described, having a very high-speed serial interface and an on-card MDC test engine that allows one MDC to be directly connected to another MDC for testing purposes. In some embodiments, a control interface allows the test engine to be programmed and controlled by a test controller on a test fixture that allows simultaneous testing of a single MDC or one or more pairs of MDCs, one MDC in a pair (e.g., the “golden” MDC) testing the other MDC of that pair. Other methods are also described, wherein one MDC executes a series of reads and writes and other commands to another MDC to test at least some of the other card's functions, or wherein one port executes a series of test commands to another port on the same MDC to test at least some of the card's functions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.