Patent · US Expired

Chip design verifying and chip testing apparatus and method

US7185295B2 · kind B2 · utility

18Cited by
8References
24Claims
0Family size

Inventors

Key dates

Filing dateJun 1, 2001
Grant dateFeb 27, 2007
Priority date
Expiry dateAug 9, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/33
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A chip design verifying and chip testing apparatus is provided including a storing means for storing an application program verifying an operation of a chip and testing the chip, the chip having a plurality of blocks, an I/O file, and a test vector; an interface means controlling a data transmission between the storing means and the chip, the interface means having a data applying means for applying the I/O file and/or the test vector outputted from the storing means and a data storing means for storing data outputted from the chip; and a computer including a CPU for performing and controlling the application program.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.