Patent · US Expired

Systems and methods for measuring belt tension

US7185546B2 · kind B2 · utility

4Cited by
5References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 14, 2004
Grant dateMar 6, 2007
Priority date
Expiry dateAug 10, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/02827
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Systems and methods for measuring belt tension in a semiconductor processing system include measuring a natural sound or an acceleration of the belt in the semiconductor processing system; digitizing the natural sound or the acceleration; determining the frequency and characterizing the belt tension as a function of the frequency.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.