Method and system for controlling temperatures in an x-ray imaging environment
US7186021B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 13, 2005 |
| Grant date | Mar 6, 2007 |
| Priority date | — |
| Expiry date | Dec 13, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/025
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Certain embodiments of the present invention provide a system for controlling temperatures in an x-ray imaging environment including: a first component capable of operating within a first temperature range; a second component capable of operating within a second temperature range; and a liquid-based temperature control system capable of maintaining the first component within the first temperature range and maintaining the second component within the second temperature range. In an embodiment, the first component includes an x-ray detector. In an embodiment, the second component includes an x-ray source. In an embodiment, a liquid in the liquid-based temperature control system flows through the first component before flowing through the second component. In an embodiment, a heat exchanger in the liquid-based temperature control system can regulate a temperature of a liquid in the liquid-based temperature control system. In an embodiment, the heat exchanger includes at least one thermoelectric cooler device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.