Characterization of a scan line produced from a facet of a scanning device
US7187398B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 25, 2005 |
| Grant date | Mar 6, 2007 |
| Priority date | — |
| Expiry date | Jul 25, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2201/04798
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for refining a length of a scan line, where the scan line is produced from a facet of a scanning device. The method includes the steps of: (a) acquiring a plurality of scan line lengths produced from the facet, (b) determining from the plurality of scan line lengths, an average scan line length for the facet, and (c) determining from the average scan line length, a scan line length correction for the facet. A method for measuring a length of a scan line includes the steps of: (a) charging an electrical current integrator to a voltage while a scan line is produced from a facet, (b) measuring the voltage, and (c) determining from the voltage, the length of the scan line produced from the facet.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.