Patent · US Expired

Optical MEMS cavity having a wide scanning range for measuring a sensing interferometer

US7187453B2 · kind B2 · utility

64Cited by
17References
92Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 23, 2004
Grant dateMar 6, 2007
Priority date
Expiry dateFeb 18, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2290/25
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for measuring the cavity length of a remote sensing interferometer by locally replicating the state of the remote sensing interferometer by way of a local interferometer. The local interferometer is produced by micro-electromechanical micro machining techniques, thus obtaining a highly accurate and reliable fiber optic sensing at a cost comparable to electronic sensing devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.