Apparatus and method for determining measure of similarity between images
US7187792B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 29, 2003 |
| Grant date | Mar 6, 2007 |
| Priority date | — |
| Expiry date | Aug 26, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system is presented in image-guided radiosurgery for determining the measure of similarity of two digital images, for example a 2D x-ray image and a 2D DRR synthesized from 3D scan data. A two-dimensional array of pixel values of a difference image is formed by subtracting each pixel value of the second image from the corresponding pixel value of the first image. The pattern intensity function is constructed by taking the summation of asymptotic functions of the gradients of the difference image. The neighborhood R is defined so as to allow the gradients of the difference image to be considered in at least four directions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.