Patent · US Expired

Defective data site information storage

US7188226B2 · kind B2 · utility

7Cited by
13References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 20, 2003
Grant dateMar 6, 2007
Priority date
Expiry dateDec 28, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2029/4402
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of storing defective data site information for a storage device according to a particular embodiment of the invention includes determining a first defective data site associated with the storage device, determining a second defective data site associated with the storage device, determining a spacing value that represents spacing between the first defective data site and the second defective data site, and storing the spacing value. Apparatus and method aspects according to other embodiments of the invention also are disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.