Self-monitoring metals, alloys and materials

US7188532B2 · kind B2 · utility

Assignee

• JENTEK Sensors, Inc. · US

Inventors

• Neil J. Goldfine · Newton, US
• Vladimir A. Zilberstein · Sharon, US
• David C. Grundy · Reading, US
• Andrew P. Washabaugh · Chula Vista, US
• Darrell E. Schlicker · Watertown, US
• Ian Shay · Cambridge, US
• Robert Joseph Lyons · Niskayuna, US
• Christopher A. Craven · Bedford, US
• Christopher Root · Somerville, US
• Mark Windoloski · Chelmsford, US
• Volker Weiss · Langenfeld, DE

Key dates

• Filing date: Sep 8, 2004
• Grant date: Mar 13, 2007
• Expiry date: Sep 8, 2024

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N27/9053
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.