Patent · US Expired

Method for measuring substance and testing piece

US7189576B2 · kind B2 · utility

118Cited by
14References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 11, 2003
Grant dateMar 13, 2007
Priority date
Expiry dateOct 14, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T436/255
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of measuring an analyte, comprising a step of measuring a detectable substance by using a reaction system including a formation reaction of the detectable substance based on a chemical reaction of the analyte contained in a sample, wherein a layered inorganic compound is caused to exist in the reaction system including the formation reaction of the detectable substance, whereby high-sensitivity measurement is made possible, the detectable substance can be stabilized to improve accuracy of the measurement, a rate of a chemical reaction is increased to enable quick measurement, and high-sensitivity measurement is made possible even in a reaction system which forms an insoluble substance. Also, it can be provided an analytical testing piece for measuring an analyte, by measuring a detectable substance by using a reaction system including a formation reaction of the detectable substance based on a chemical reaction of the analyte contained in a sample, wherein the testing piece comprises at least one test portion having a detection portion for detecting the detectable substance and contains a layered inorganic compound at least in the test portion, whereby diffusion and elutio…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.