Method and apparatus for determining a bidirectional reflectance distribution function, subsurface scattering or a bidirectional texture function of a subject
US7190461B2 · kind B2 · utility
47Cited by
2References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 1, 2004 |
| Grant date | Mar 13, 2007 |
| Priority date | — |
| Expiry date | Jun 11, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4711
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for determining a bidirectional reflectance distribution function of a subject. In one embodiment, the apparatus includes a light source for producing light. The apparatus includes means for measuring the bidirectional reflectance distribution function of the subject from multiple locations simultaneously with the light. A method for determining a bidirectional reflectance distribution function of a subject.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.