Patent · US Expired

Data signal quality evaluation method and apparatus using high speed sampling

US7190752B2 · kind B2 · utility

5Cited by
6References
49Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 9, 2003
Grant dateMar 13, 2007
Priority date
Expiry dateMay 23, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B10/07953
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

The scale and complexity of an apparatus is reduced by omitting a clock extraction section. The apparatus includes: a sampling pulse train generation device which generates an optical or electrical sampling pulse train, independently of an input optical or electrical data signal with a bit rate f0(bit/s), and which has a repetition frequency f1(Hz); a data signal sampling device which samples the data signal in accordance with the sampling pulse train to obtain a sampled signal; a voltage retaining device which converts the sampled signal, and stores pieces of electrical digital data; an electrical signal processing device which reads the digital data at once or sequentially to obtain a signal eye-diagram and evaluates optical data signal quality parameters; and a trigger signal generation device which applies triggers indicating the start/finish of data acquisition and data read to the voltage retaining device and the electrical signal processing device, respectively.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.