Patent · US Expired

Method and system for memory temperature detection and thermal load management

US7191088B1 · kind B1 · utility

33Cited by
2References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 25, 2004
Grant dateMar 13, 2007
Priority date
Expiry dateOct 25, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01K7/425
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and system for memory temperature measurement. The method includes the step of monitoring a plurality of accesses to a memory component. A number of accesses occurring to the memory component over a time period is determined. A temperature of the memory component is determined based on the number of accesses occurring over the time period.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.