Advanced cable metrology system
US7191091B2 · kind B2 · utility
0Cited by
3References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 1, 2004 |
| Grant date | Mar 13, 2007 |
| Priority date | — |
| Expiry date | Dec 15, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is a method for determining the center to center spacing of conductors in an insulated, multi-conductor, flat cable. The method comprising applying an X-ray field to the cable, detecting the X-ray field intensity that passes through the cable, obtaining a digitized output waveform of the X-ray field intensity as a function of cable position, and determining a trough location of the waveform by averaging calculated position values for the center of the conductor at several longitudinal positions along a cross section of the conductor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.