Systems for aptitude tests for testing an object for its intended application
US7191094B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 10, 2003 |
| Grant date | Mar 13, 2007 |
| Priority date | — |
| Expiry date | Oct 30, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/00752
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to an aptitude test system (4) which includes at least one object (1) which is provided with a data carrier (2) on which data associated with the object (1) is stored, as well as a test device (5) which includes a reading apparatus (6) whereby the data of the data carrier (2) can be transfer-red to a computer (7). The data includes aptitude data which characterizes at least one permissible application for the associated object (1). The computer (7) has access to current application data which characterizes a concrete application intended for the relevant object (1). For aptitude testing of the relevant object (1) the computer evaluates the aptitude data thereof and the actual application data. The computer (7) outputs a release signal when the object (1) is suitable for the intended application.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.