Patent · US Expired

Optimized storage for measurement data

US7191184B2 · kind B2 · utility

36Cited by

8References

26Claims

0Family size

Assignee

National Instruments Corporation · US

Inventors

Guy Vachon Laborde · Austin, US
David Mark Pierce · Austin, US
Andreas Peter Haub · Roetgen, DE
Stefan Romainczyk · Aachen, DE
Helmut Helpenstein · Erkelenz, DE

Key dates

Filing date	May 2, 2002
Grant date	Mar 13, 2007
Priority date	—
Expiry date	Nov 26, 2023

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10S707/99945
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A system and method for storing measurements. Each measurement may include bulk data and attribute data. The bulk data and the attribute data may be stored using different storage mechanisms. In one embodiment, relational database technology may be used to store the attribute data. Relational database technology may facilitate querying or searching on the attribute data. The bulk data may be stored in a database specialized for storing bulk data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.