Patent · US Expired

Schmoo runtime reduction and dynamic calibration based on a DLL lock value

US7191279B2 · kind B2 · utility

2Cited by
2References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 2003
Grant dateMar 13, 2007
Priority date
Expiry dateJun 5, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2207/2254
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Methods of setting numerically controlled delay lines using step sizes based on a delay locked loop lock value are presented herein. In one embodiment, a method may comprise, for example, one or more of the following: calculating an offset value for at least one NCDL; and interpolating a new offset value for the at least one NCDL, based on a change in a delay locked loop (DLL) output value from a previous DLL output value to a new DLL output value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.