Inertial measurement system and method with sensor bias cancellation
US7191636B2 · kind B2 · utility
4Cited by
7References
20Claims
0Family size
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Key dates
| Filing date | Mar 4, 2005 |
| Grant date | Mar 20, 2007 |
| Priority date | — |
| Expiry date | Aug 1, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C19/5776
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Inertial measurement system and method in which a base is rotated about an input axis in accordance with a rotation to be measured, rotation about the input axis is sensed with one or more angular rate sensors, fixed bias offset is cancelled by dithering the sensors about an axis perpendicular to their sensing axes to vary the orientation of the sensing axes relative to the base in an oscillatory manner, and signals from the sensors are demodulated at the dithering frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.