Patent · US Expired

Capacitive pressure sensor

US7191661B2 · kind B2 · utility

2Cited by
3References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 15, 2005
Grant dateMar 20, 2007
Priority date
Expiry dateJul 10, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01L9/0073
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A capacitive pressure sensor made up of two silicon on insulator (SOI) wafers lying opposite of each other and joined to each other in a vacuum-tight manner, a recess being formed between the two wafers. The first wafer exclusively supports the evaluation circuits required for measuring the applied pressure and a capacitive electrode, and the second wafer has a recess formed by surface micromechanics processes, in which the counter electrode to the capacitive electrode of the first wafer is situated. The second wafer at the same time forms a cover for the first wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.