Patent · US Expired

Radio frequency identification device implemented with a metal-gate semiconductor fabrication process

US7191953B2 · kind B2 · utility

6Cited by
2References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 1, 2005
Grant dateMar 20, 2007
Priority date
Expiry dateOct 7, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06K19/0723
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention discloses a radio frequency identification device implemented with a metal-gate semiconductor fabrication process, wherein the charge capacitor, which is formed by the special parasitic N-type and P-type guard rings in the chip fabricated with the metal-gate process, incorporated with the original P-type and N-type transistors of metal oxide semiconductor (PMOS/NMOS) not only can provide a horizontal surface current but also can provide a rectified current for the performance of the entire circuit, which can advance the metal gate process to RFID industry in cooperation with an identification code holder circuit and a non-synchronous local oscillation circuit so that the fabrication cost can be lowered and the fabrication time can be shortened.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.