Patent · US Expired

Corn event PV-ZMGT32(nk603) and compositions and methods for detection thereof

US7193071B2 · kind B2 · utility

5Cited by
8References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 1, 2004
Grant dateMar 20, 2007
Priority date
Expiry dateMar 1, 2024

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC12Q2600/158
  • WIPO fieldBiotechnology
  • WIPO sectorChemistry

Abstract

The present invention provides a DNA construct that confers tolerance to transgenic corn plant. Also provided are assays for detecting the presence of the PV-ZMGT32(nk603) corn event based on the DNA sequence of the recombinant construct inserted into the corn genome and of genomic sequences flanking the insertion site.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.