Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate
US7193712B2 · kind B2 · utility
6Cited by
4References
20Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Oct 14, 2004 |
| Grant date | Mar 20, 2007 |
| Priority date | — |
| Expiry date | Oct 14, 2024 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B2560/0233
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate are disclosed. The methods and apparatus generate electromagnetic waves and capture a portion of the generated waves after the waves pass through a first polarized filter, reflect from a substrate, and pass through a second polarized filter arranged in a cross polar arrangement with respect to the first polarized filter. Digital data is determined from the captured electromagnetic waves. Based on the digital data, the customer is given certain choices and/or informed of certain personal care product recommendations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.