Patent · US Expired

Method and system for detecting anomalies in multispectral and hyperspectral imagery employing the normal compositional model

US7194132B1 · kind B1 · utility

2Cited by
2References
6Claims
0Family size

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Inventor

Key dates

Filing dateJun 4, 2003
Grant dateMar 20, 2007
Priority date
Expiry dateAug 2, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V20/13
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for detecting anomalies from multidimensional data comprises: a) receiving multidimensional data; b) estimating background parameters of a normal compositional model from the multidimensional data; c) estimating abundance values of the normal compositional model from the background parameters and the multidimensional data; d) determining an anomaly detection statistic from the multidimensional data, the background parameters, and abundance values; and e) classifying an observation from the multidimensional data as either a background reference or an anomaly from the anomaly detection statistic.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.