Patent · US Expired

Apparatus and method for determining the minimum zone for an array of features with a true position tolerance

US7194387B1 · kind B1 · utility

5Cited by
1References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 30, 2005
Grant dateMar 20, 2007
Priority date
Expiry dateSep 30, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2111/08
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus for determining the minimum zone for an array of features with a true position tolerance. In one embodiment, a target function is defined according to a deviation value of each of at least two features from an array of features having a maximum deviation between an actual position and a nominal position. Once defined, the target function is minimized to determine a rotation parameter, a horizontal translation parameter and a vertical translation parameter that provide a minimum target function value as a minimum of the maximum deviation for the array of features. In one embodiment, an inspection report may be generated for the array of features, including at least the minimum, maximum deviation value, as well as the rotation parameter, the horizontal translation parameter and the vertical translation parameter that provide the minimum target function value. Other embodiments are described and claimed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.