Patent · US Expired

Apparatus and method for identifying patterns in a multi-dimensional database

US7194465B1 · kind B1 · utility

23Cited by
9References
8Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 28, 2002
Grant dateMar 20, 2007
Priority date
Expiry dateFeb 12, 2024

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S707/99936
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An apparatus to identify patterns in a multi-dimensional database is described. In particular, a computer-readable medium to direct a computer to function in a specified manner is provided. The computer-readable medium comprises instructions to automatically identify a plurality of patterns associated with data comprising the multi-dimensional database and instructions to indicate the plurality of patterns that are identified. Exemplary patterns that can be identified include an outlier pattern, a step pattern, a random pattern, a trend pattern, and a periodic pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.