Patent · US Expired

Method of processing test information

US7194474B2 · kind B2 · utility

4Cited by
7References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 1, 2000
Grant dateMar 20, 2007
Priority date
Expiry dateDec 1, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S707/99945
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An NDE test data record management system is provided. The test data record management system can include a format conversion server, a local archiving server, a cataloging server, an image and data cache server, and an image query and review station.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.