Method of evaluating positioning accuracy of a magnetic head tester
US7196861B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 14, 2004 |
| Grant date | Mar 27, 2007 |
| Priority date | — |
| Expiry date | Oct 14, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/20
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of evaluating the positioning accuracy of a magnetic head tester can accurately test magnetic heads and so can reliably provide non-defective goods. In a method of evaluating the positioning accuracy of a magnetic head tester that tests the performance of a magnetic head 14 by carrying out writing and reading operations on a magnetic medium 12 using the magnetic head 14. A plurality of GAPS profiles are acquired by repeatedly carrying out a GAPS test that measures a GAP offset amount for the same magnetic head 14 that has been attached to the magnetic head tester, a GAP offset fluctuation amount is calculated from the acquired plurality of GAPS profiles, and the calculation result is set as an index for evaluating the position reproducibility of the magnetic head.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.