System and method for memory compiler characterization
US7197438B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 18, 2001 |
| Grant date | Mar 27, 2007 |
| Priority date | — |
| Expiry date | Dec 22, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/327
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A memory compiler characterization system and method for determining parametric data, wherein memory compilers of a first type are rigorously characterized and memory compilers of a second type are sparsely characterized with respect to a particular parameter. Absolute scale factors are determined based on the ratio of the parametric data points of two congruent memory compilers, one from each type. Interpolated scale factors are obtained based on the absolute scale factors. Parametric data for the remaining compilers of the sparsely characterized compiler set is filled out by applying the interpolated scale factors in conjunction with the data of the congruent memory compilers of the first type.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.