TFT-LCD source driver with built-in test circuit and method for testing the same
US7199575B2 · kind B2 · utility
2Cited by
4References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 26, 2005 |
| Grant date | Apr 3, 2007 |
| Priority date | — |
| Expiry date | Apr 26, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2330/12
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A TFT-LCD source driver with a built-in test circuit includes N driving units and P test units. Each driving unit receives digital data and generates an analog output signal according to the digital data. Each test unit receives the analog output signals, selects one of them as a test signal according to a select signal, and compares the test signal with a high reference voltage and a low reference voltage to output an indication signal. The indication signal is set to indicate an abnormal state as the voltage of the test signal is higher than the high reference voltage or lower than the low reference voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.