Patent · US Expired

Apparatus for and method of measurements of components

US7199881B2 · kind B2 · utility

1Cited by

3References

16Claims

0Family size

Assignee

CLAAS Fertigungstechnik GmbH · DE

Inventors

Ludger Martinschledde · Rietberg, DE
Guenter Herrmann · Vellmar, DE
Juergen Eckstein · Schwaikheim, DE
Michael Krauhausen · Aachen, DE

Key dates

Filing date	Mar 21, 2006
Grant date	Apr 3, 2007
Priority date	—
Expiry date	Mar 21, 2026

Classification

Technology area (CPC H)Electricity
CPC primaryH04N13/254
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

An arrangement for measuring components has a manipulator, at least one measuring system in operative connection with the manipulator, the at least one measuring system including at least one contour measuring device associated with the manipulator and generating an optical sensing surface sweeping a measuring region, an at least one measuring object arranged in the measuring region and at least one reference feature associated with the measuring object; and a method of measurements is performed with the arrangement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.