Method and system for determining origin of optical signal quality degradation
US7200328B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 19, 2002 |
| Grant date | Apr 3, 2007 |
| Priority date | — |
| Expiry date | Oct 10, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/07953
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A monitoring system includes first and second evaluation sections for obtaining an averaged Q-factor parameter and a waveform distortion parameter from an optical signal amplitude histogram collected from optical signals under measurement. The monitoring system further includes a third evaluation section for determining both averaged Q-factor parameter and waveform distortion parameter, and for making a decision as to whether the main factor of the optical signal quality degradation is waveform distortion or not by comparing the averaged Q-factor parameter and waveform distortion parameter with their initial values or initial characteristics which are obtained when no optical signal quality degradation is present.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.