Dual connection power line parameter analysis method and system
US7200502B2 · kind B2 · utility
20Cited by
14References
25Claims
0Family size
Assignee
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Key dates
| Filing date | Mar 30, 2005 |
| Grant date | Apr 3, 2007 |
| Priority date | — |
| Expiry date | Apr 15, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus is disclosed for determining the power line parameters of a system. Specifically, there is provided a method comprising perturbing a voltage waveform through a first connection, measuring a characteristic of the perturbation through a second connection, and calculating a line impedance based on the characteristic of the perturbation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.