Axial flow scan testable filter system
US7201039B2 · kind B2 · utility
6Cited by
4References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 13, 2005 |
| Grant date | Apr 10, 2007 |
| Priority date | — |
| Expiry date | Sep 13, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/084
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
A filter system having in-situ scan capabilities is provided. In one embodiment of the invention, the system includes a downstream probe which may be rotated to scan the field of a filter installed in the system. The probe may be utilized for leak detection, velocity measurements, efficiency testing and the like. In one embodiment, one or more probes are rotated downstream of the filter to scan the downstream face of the filter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.