Automatic optical inspection system and method
US7203355B2 · kind B2 · utility
11Cited by
9References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 24, 2002 |
| Grant date | Apr 10, 2007 |
| Priority date | — |
| Expiry date | Feb 15, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/0004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.