Clustering-based approach for coverage-directed test generation
US7203882B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2004 |
| Grant date | Apr 10, 2007 |
| Priority date | — |
| Expiry date | May 20, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318371
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A coverage-directed test generation technique for functional design verification relies on events that are clustered according to similarities in the way that the events are stimulated in a simulation environment, not necessarily related to the semantics of the events. The set of directives generated by a coverage-directed test generation engine for each event is analyzed and evaluated for similarities with sets of directives for other events. Identified similarities in the sets of directives provide the basis for defining event clusters. Once clusters have been defined, a common set of directives for the coverage-directed test generation engine is generated that attempts to cover all events in a given cluster.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.